Product Overview
Product Category: | Embedded - FPGAs (Field Programmable Gate Array) |
Kynix Part #: | KY32-APA150-TQG100I |
Manufacturer Part#: | APA150-TQG100I |
Manufacturer: | Microsemi Corporation |
Description: | FPGA ProASICPLUS Family 150K Gates 180MHz 0.22um Technology 2.5V 100-Pin TQFP Tray |
Package: | QFP |
Datasheet: | APA150-TQG100I Datasheet |
Stock: | Yes |
Quantity: | 780PCS |
APA150-TQG100I Images are for reference only:
Product Specifications
Product Category | FPGA - Field Programmable Gate Array |
Shipping Restrictions | This product may require additional documentation to export from the United States. |
Package Description | 0.50 MM PITCH, ROHS COMPLIANT, TQFP-100 |
Number of I/Os | 66 |
Operating Supply Voltage (V) | 2.5 |
Mounting Style | SMD/SMT |
Package / Case | TQFP-100 |
Package Shape | SQUARE |
Package Style | FLATPACK, LOW PROFILE, FINE PITCH |
Packaging | Tray |
Height (mm) | 1.4 |
Length (mm) | 14 |
Series | ProASICPLUS |
Width (mm) | 14 |
Brand | Microsemi |
Maximum Operating Frequency (MHz) | 180 |
Factory Pack Quantity | 90 |
Subcategory | Programmable Logic ICs |
Supply Voltage - Max (V) | 2.7 |
Supply Voltage - Min (V) | 2.3 |
Tradename | Actel |
Unit Weight | 0.023175oz |
Total RAM (bit) | 36864 |
Number of Gates | 150000 |
Mounting | Surface Mount |
Operating Temperature | -40°C ~ 85°C (TA) |
Package / Case | 100-LQFP |
Supplier Device Package | 100-TQFP (14x14) |
Base Part Number | APA150 |
Environmental & Export | Classifications |
Lead Free Status / RoHS Status | Compliant |
Moisture Sensitivity Level (MSL) | 3 (168 Hours) |
ECCN (US) | 3A001.a.7.a |
Part Status | Active |
HTS | 8542.39.00.01 |
Clock Frequency-Max (MHz) | 180 |
JESD-30 Code | S-PQFP-G100 |
JESD-609 Code | e3 |
Process Technology (um) | 0.22 |
Number of Inter Dielectric Layers | 4 |
Number of Registers | 6144 |
Program Memory Type | Flash |
Embedded Memory (Kbit) | 36 |
Total Number of Block RAM | 16 |
Device System Gates | 150000 |
Number of Global Clocks | 4 |
Device Number of DLLs/PLLs | 2 |
PCIe | 1 |
Programmability | Yes |
Reprogrammability Support | Yes |
Copy Protection | No |
In-System Programmability | Yes |
Speed Grade | STD |
I/O Voltage (V) | 3.3|2.5 |
Supplier Temperature Grade | Industrial |
TradenamePro | ASIC |
Supplier Package | TQFP |
Standard Package Name | QFP |
Pin Count | 100 |
PCB changed | 100 |
Lead Shape | Gull-wing |
Technology | CMOS |
Temperature Grade | INDUSTRIAL |
Terminal Finish | MATTE TIN |
Terminal Form | GULL WING |
Terminal Pitch(mm) | 0.5 |
Terminal Position | QUAD |
APA150-TQG100I Datasheet PDF Download:
Pin Description
User Pins
I/O User | Input/Output |
The I/O pin functions as an input, output, tristate, or bidirectional buffer. Input and output signal levels are compatible with standard LVTTL and LVCMOS specifications. Unused I/O pins are configured as inputs with pull-up resistors. |
NC | No Connect |
To maintain compatibility with other Actel ProASICPLUS products, it is recommended that this pin not be connected to the circuitry on the board. |
GL | Global Pin |
Low skew input pin for clock or other global signals. This pin can be configured with an internal pull-up resistor. When it is not connected to the global network or the clock conditioning circuit, it can be configured and used as a normal I/O. |
GLMX Global | Multiplexing Pin |
Low skew input pin for clock or other global signals. This pin can be used in one of two special ways (refer to Actel’s Using ProASIC PLUS Clock Conditioning Circuits). | |
When the external feedback option is selected for the PLL block, this pin is routed as the external feedback source to the clock conditioning circuit. | |
In applications where two different signals access the same global net at different times through the use of GLMXx and GLMXLx macros, this pin will be fixed as one of the source pins. | |
This pin can be configured with an internal pull-up resistor. When it is not connected to the global network or the clock conditioning circuit, it can be configured and used as any normal I/O. If not used, the GLMXx pin will be configured as an input with pull-up. |
Dedicated Pins
GND | Ground |
Common ground supply voltage. | |
VDD | Logic Array Power Supply Pin |
2.5 V supply voltage. | |
VDDP | I/O Pad Power Supply Pin |
2.5 V or 3.3 V supply voltage. |
TMS | Test Mode Select |
The TMS pin controls the use of boundary-scan circuitry. This pin has an internal pull-up resistor. | |
TCK | Test Clock |
Clock input pin for boundary scan (maximum 10 MHz). Actel recommends adding a nominal 20 kΩ pull-up resistor to this pin. | |
TDI | Test Data In |
Serial input for boundary scan. A dedicated pull-up resistor is included to pull this pin high when not being driven. | |
TDO | Test Data Out |
Serial output for boundary scan. Actel recommends adding a nominal 20kΩ pull-up resistor to this pin. | |
TRST | Test Reset Input |
Asynchronous, active low input pin for resetting boundary-scan circuitry. This pin has an internal pull-up resistor. For more information, please refer to Power-up Behavior of ProASIC PLUS Devices application note. |
Special Function Pins
RCK | Running Clock |
A free running clock is needed during programming if the programmer cannot guarantee that TCK will be uninterrupted. If not used, this pin has an internal pullup and can be left floating. | |
NPECL | User Negative Input |
Provides high speed clock or data signals to the PLL block. If unused, leave the pin unconnected. | |
PPECL | User Positive Input |
Provides high speed clock or data signals to the PLL block. If unused, leave the pin unconnected. | |
AVDD | PLL Power Supply |
Analog VDD should be VDD (core voltage) 2.5 V (nominal) and be decoupled from GND with suitable decoupling capacitors to reduce noise. For more information, refer to Actel’s Using ProASIC PLUS Clock Conditioning Circuits application note. If the clock conditioning circuitry is not used in a design, AVDD can either be left floating or tied to 2.5 V. | |
AGND | PLL Power Ground |
The analog ground can be connected to the system ground. For more information, refer to Actel’s Using ProASIC PLUS Clock Conditioning Circuits application note. If the PLLs or clock conditioning circuitry are not used in a design, AGND should be tied to GND. |
Package Pin Assignments
Fig. 1 100-Pin TQFP
Fig. 2 144-Pin FBGA
Fig. 3 144-Pin TQFP
Fig. 4 208-Pin CQFP
Fig. 5 208-Pin PQFP
Fig. 6 256-Pin FBGA
Fig. 7 352-Pin CQFP
Fig. 8 456-Pin PBGA
Fig. 9 484-Pin FBGA
Fig. 10 624-Pin CCGA LGA
Fig. 11 676-Pin FBGA
Fig. 12 896-Pin FBGA
Fig. 13 1152-Pin FBGA
Features and Benefits
High Capacity
Commercial and Industrial
• 75,000 to 1 Million System Gates
• 27 K to 198 Kbits of Two-Port SRAM
• 66 to 712 User I/Os
Military
• 300, 000 to 1 Million System Gates
• 72 K to 198 Kbits of Two Port SRAM
• 158 to 712 User I/Os
Reprogrammable Flash Technology
• 0.22 µm 4 LM Flash-Based CMOS Process
• Live At Power-Up (LAPU) Level 0 Support
• Single-Chip Solution
• No Configuration Device Required
• Retains Programmed Design during Power-Down/Up Cycles
• Mil/Aero Devices Operate over Full Military Temperature Range
Performance
• 3.3 V, 32-Bit PCI, up to 50 MHz (33 MHz over military
temperature)
• Two Integrated PLLs
• External System Performance up to 150 MHz
Secure Programming
• The Industry’s Most Effective Security Key (FlashLock®)
Low Power
• Low Impedance Flash Switches
• Segmented Hierarchical Routing Structure
• Small, Efficient, Configurable (Combinatorial or Sequential) Logic Cells
High Performance Routing Hierarchy
• Ultra-Fast Local and Long-Line Network
• High-Speed Very Long-Line Network
• High-Performance, Low Skew, Splittable Global Network
• 100% Routability and Utilization
I/O
• Schmitt-Trigger Option on Every Input
• 2.5 V / 3.3 V Support with Individually-Selectable Voltage and Slew Rate
• Bidirectional Global I/Os
• Compliance with PCI Specification Revision 2.2
• Boundary-Scan Test IEEE Std. 1149.1 (JTAG) Compliant
• Pin-Compatible Packages across the ProASICPLUS Family
Unique Clock Conditioning Circuitry
• PLL with Flexible Phase, Multiply/Divide, and Delay
Capabilities
• Internal and/or External Dynamic PLL Configuration
• Two LVPECL Differential Pairs for Clock or Data Inputs
Standard FPGA and ASIC Design Flow
• Flexibility with Choice of Industry-Standard Front-End Tools
• Efficient Design through Front-End Timing and Gate Optimization
ISP Support
• In-System Programming (ISP) via JTAG Port
SRAMs and FIFOs
• SmartGen Netlist Generation Ensures Optimal Usage of
Embedded Memory Blocks
• 24 SRAM and FIFO Configurations with Synchronous and Asynchronous Operation up to 150 MHz (typical)
Other data sheets within the file:
APA150-TQG100I Datasheet | ![]() |
Actel - PCN - 7-28-10 | ![]() |
Actel - PCN 5-18-10 | ![]() |
Product Change Notification | ![]() |
Product Change Notification | ![]() |